International Symposium for Testing and Failure Analysis (ISTFA) 2012

ISTFA is the international venue devoted to the semiconductor, electronic sample preparation and imaging markets. Hitachi will showcase our latest products and solutions for sample preparation and failure analysis. Visit us at Booth #300 at Phoenix Convention Center, Phoenix, AZ.

Date - Time: 
Tuesday, November 13, 2012 - 09:30 to Wednesday, November 14, 2012 - 16:00
Phoenix Convention Center, Phoenix, AZ